Nature of Low-Frequency Excess Noise in n-Type Gallium Nitride

Changsheng Zhu; W.K. Fong; B.H. Leung; Chun Cheng; C. Surya

doi:10.1557/proc-622-t6.23.1

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Nature of Low-Frequency Excess Noise in n-Type Gallium Nitride

Changsheng Zhu W.K. Fong B.H. Leung Chun Cheng C. Surya

Year: 2000 Journal: MRS Proceedings Vol: 622 Publisher: Cambridge University Press

DOI: 10.1557/proc-622-t6.23.1

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Keywords:

Materials science Flicker noise Annealing (glass) Crystallinity Noise (video) Analytical Chemistry (journal) Diffraction Atmospheric temperature range Molecular beam epitaxy Full width at half maximum Condensed matter physics Optoelectronics Physics Noise figure Epitaxy Optics Chemistry Nanotechnology Thermodynamics Composite material

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GaN-based semiconductor devices and materials

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Semiconductor Quantum Structures and Devices

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Nature of Low-Frequency Excess Noise in n-Type Gallium Nitride

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