JOURNAL ARTICLE

56.2: Invited Paper: Low Temperature Poly‐Si TFTs with Advanced Device Structures

Min‐Koo HanIn Hyuk Song

Year: 2003 Journal:   SID Symposium Digest of Technical Papers Vol: 34 (1)Pages: 1490-1493   Publisher: Wiley

Abstract

Abstract We report several advanced excimer laser annealed poly‐Si TFTs device structures which improve field effect mobility, reliability and kink problem. For practical display application, kink effect and reliability issues should be investigated and LBT(Lateral Body Terminal) found to be effective. Air cavity is also effective to reliability and leakage problems. High device mobility exceeding 500 cm 2 /Vsec has been obtained by excimer laser irradiation on a selectively floating a‐Si thin film.

Keywords:
Reliability (semiconductor) Materials science Optoelectronics Excimer laser Leakage (economics) Laser Thin-film transistor Optics Nanotechnology

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Citation History

Topics

Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
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