Abstract

The aim of this work is to compare the isothermal crystallization kinetic in the films along GeTe-Sb 2 Te 3 line with composition Ge 2 Sb 2 Te 5 , Ge 1 Sb 2 Te 4 , Ge 1 Sb 4 Te 7 and Ge 4 Sb 1 Te 5 using mainly Johnson-Mehl-Avrami-Kolmogorov (JMAK) model. Results obtained have shown different crystallization mechanism in the investigated films. In Ge 2 Sb 2 Te 5 and Ge 1 Sb 2 Te 4 films the analysis of the kinetic results (Avrani coefficient) showed that at the beginning of crystallization a metastable phase appeared with the Ge 1 Sb 4 Te 7 composition, this is followed by the nucleation and growth of the stable fcc phase up to full crystallization. In contrast Ge 4 Sb 1 Te 5 and Ge 1 Sb 4 Te 7 films show diffusion control growing from small dimension grains with decreasing nucleation rate.

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Computer science

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Topics

Phase-change materials and chalcogenides
Physical Sciences →  Materials Science →  Materials Chemistry
Chalcogenide Semiconductor Thin Films
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced Thermoelectric Materials and Devices
Physical Sciences →  Materials Science →  Materials Chemistry
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