JOURNAL ARTICLE

X-ray diffraction from pinned charge density waves

Stéphan RouzièreS. RavyS. BrazovskiǐJean‐Paul Pouget

Year: 1999 Journal:   Journal de Physique IV (Proceedings) Vol: 09 (PR10)Pages: Pr10-23   Publisher: Springer Science+Business Media

Abstract

We present an x-ray study of doped charge density waves systems. When a 2k_f-charge density wave is strongly pinned to impurities, an interference effect gives rise to an asymmetry between the intensities of the +2k_f and -2k_f satellite reflections. Moreover, profile asymmetry of the satellite reflections indicates the existence of Friedel oscillations (FOs) around the defects. We have studied these effects in V- and W-doped blue bronzes. A syncrotron radiation study of the V-doped blue bronze clearly reveals the presence of FO around the V atoms.

Keywords:
Diffraction X-ray Charge density Charge density wave Charge (physics) Physics Materials science Optics Condensed matter physics Quantum mechanics

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