Charge Density Analysis from X-Ray Diffraction

R. Saravanan; M. Prema Rani

doi:10.1007/978-1-4471-2204-3_2

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Charge Density Analysis from X-Ray Diffraction

R. Saravanan M. Prema Rani

Year: 2011 Pages: 31-64

DOI: 10.1007/978-1-4471-2204-3_2

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Keywords:

Multipole expansion Charge density Diffraction Rietveld refinement Maximum entropy method Crystal structure Computational physics Crystal (programming language) Statistical physics Materials science Physics Crystallography Computer science Chemistry Optics Quantum mechanics

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X-ray Diffraction in Crystallography

Physical Sciences → Materials Science → Materials Chemistry

High-pressure geophysics and materials

Physical Sciences → Earth and Planetary Sciences → Geophysics

Machine Learning in Materials Science

Physical Sciences → Materials Science → Materials Chemistry

Charge Density Analysis from X-Ray Diffraction

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