Quantitative analysis of X-ray fluorescence without standard reference samples

Abstract

X-ray fluorescence (XRF) is a non-destructive technique for elemental analysis. But the accuracy of the quantitative analysis of XRF is not as good as other techniques due to the matrix effects. In this paper, we proposed a new method by making the bulk samples into thin films with proper thickness to reduce the matrix effect, and taking into account of bremsstrahlung radiation as part of the incident X-ray intensity.