Quantitative analysis by X-ray photoelectron spectroscopy without reference samples

Maria F. Ebel; H. Ebel; K. Hirokawa

doi:10.1016/0584-8547(82)80020-7

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Quantitative analysis by X-ray photoelectron spectroscopy without reference samples

Maria F. Ebel H. Ebel K. Hirokawa

Year: 1982 Journal: Spectrochimica Acta Part B Atomic Spectroscopy Vol: 37 (6)Pages: 461-471 Publisher: Elsevier BV

DOI: 10.1016/0584-8547(82)80020-7

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Keywords:

X-ray photoelectron spectroscopy Photoelectric effect Spectroscopy Inelastic mean free path Analytical Chemistry (journal) Materials science Chemistry Physics Inelastic scattering Nuclear magnetic resonance Optics Scattering

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Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

X-ray Spectroscopy and Fluorescence Analysis

Physical Sciences → Physics and Astronomy → Radiation

Advancements in Photolithography Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Quantitative analysis by X-ray photoelectron spectroscopy without reference samples

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