Permittivity characterization from transmission-line measurement

Michael D. Janezic; Dylan F. Williams

doi:10.1109/mwsym.1997.596577

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Permittivity characterization from transmission-line measurement

Michael D. Janezic Dylan F. Williams

Year: 2002 Vol: 3 Pages: 1343-1346

DOI: 10.1109/mwsym.1997.596577

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Abstract

We analyze three accurate broadband techniques for measuring the complex permittivity of dielectric substrates using coplanar waveguide transmission-line measurements and demonstrate good agreement with single-frequency cavity measurements

Keywords:

Permittivity Transmission line Characterization (materials science) Materials science Relative permittivity Optoelectronics Electronic engineering Optics Computer science Dielectric Physics Telecommunications Nanotechnology Engineering

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Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave Engineering and Waveguides

Physical Sciences → Engineering → Electrical and Electronic Engineering

Electromagnetic Compatibility and Noise Suppression

Physical Sciences → Engineering → Electrical and Electronic Engineering

Permittivity characterization from transmission-line measurement

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