JOURNAL ARTICLE

Growth of epitaxial ultrathin continuous CoSi2 layers on Si(111)

J. HenzH. von KänelM. OspeltP. Wächter

Year: 1987 Journal:   Surface Science Vol: 189-190 Pages: 1055-1061   Publisher: Elsevier BV
Keywords:
Epitaxy Materials science Annealing (glass) X-ray photoelectron spectroscopy Reflection high-energy electron diffraction Crystallography Evaporation Analytical Chemistry (journal) Optoelectronics Nanotechnology Chemistry Layer (electronics) Composite material Chemical engineering

Metrics

37
Cited By
4.15
FWCI (Field Weighted Citation Impact)
11
Refs
0.95
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Materials Characterization Techniques
Physical Sciences →  Engineering →  Biomedical Engineering

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