Epitaxial CoSi2/Si(111) interfaces

R. T. Tung; F. Schrey

doi:10.1016/0169-4332(89)90061-5

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Epitaxial CoSi2/Si(111) interfaces

R. T. Tung F. Schrey

Year: 1990 Journal: Applied Surface Science Vol: 41-42 Pages: 223-229 Publisher: Elsevier BV

DOI: 10.1016/0169-4332(89)90061-5

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Keywords:

Materials science Epitaxy Transmission electron microscopy Deposition (geology) Single crystal Crystallography Optoelectronics Layer (electronics) Nanotechnology Chemistry

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Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advanced Materials Characterization Techniques

Physical Sciences → Engineering → Biomedical Engineering

Epitaxial CoSi2/Si(111) interfaces

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