ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

Lekshmi Kailas; Jean‐Nicolas Audinot; H.-N. Migeon; P. Bertrand

doi:10.1016/j.apsusc.2004.03.063

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ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

Lekshmi Kailas Jean‐Nicolas Audinot H.-N. Migeon P. Bertrand

Year: 2004 Journal: Applied Surface Science Vol: 231-232 Pages: 289-295 Publisher: Elsevier BV

DOI: 10.1016/j.apsusc.2004.03.063

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Keywords:

Copolymer Materials science Annealing (glass) Methyl methacrylate Secondary ion mass spectrometry Polystyrene Thin film Analytical Chemistry (journal) Static secondary-ion mass spectrometry Polymer chemistry Chemical engineering Nanotechnology Composite material Chemistry Mass spectrometry Polymer Organic chemistry Chromatography

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Block Copolymer Self-Assembly

Physical Sciences → Materials Science → Materials Chemistry

Ion-surface interactions and analysis

Physical Sciences → Engineering → Computational Mechanics

Polymer Surface Interaction Studies

Physical Sciences → Materials Science → Surfaces, Coatings and Films

ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

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