D. BriggsI. W. FletcherS. ReichlmaierJ. L. Agulo‐SanchezRobert D. Short
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) studies, utilizing both laterial imaging and shallow depth profiling, of a 50:50 poly(vinyl chloride)/poly(methyl methacrylate) (PVC:PMMA) blend have confirmed the presence of a thin overlayer of PMMA on the phase-separated bulk morphology.
Dayrl P. BriggsI. W. FletcherS. ReichlmaierJ. L. Agulo‐SanchezRobert D. Short
Stuart Thomas JacksonRobert D. Short
Daniel LéonardP. BertrandM. K. ShiE. SacherL. Martinů
Lekshmi KailasJean‐Nicolas AudinotH.-N. MigeonP. Bertrand