Heungsoo KimC. M. GilmoreJ. S. HorwitzAlberto PiquéHideyuki MurataGary P. KushtoRuediger SchlafZakya H. KafafiDouglas B. Chrisey
Aluminum-doped zinc oxide (AZO) thin films (∼3000 Å) with low electrical resistivity and high optical transparency have been grown by pulsed-laser deposition on glass substrates without a postdeposition anneal. Films were deposited at substrate temperatures ranging from room temperature to 400 °C in O2 partial pressures ranging from 0.1 to 50 mTorr. For 3000-Å-thick AZO films grown at room temperature in an oxygen pressure of 5 mTorr, the electrical resistivity was 8.7×10−4 Ω cm and the average optical transmittance was 86% in the visible range (400–700 nm). For 3000-Å-thick AZO films deposited at 200 °C in 5 mTorr of oxygen, the resistivity was 3.8×10−4 Ω cm and the average optical transmittance in the visible range was 91%. AZO films grown at 200 °C were used as an anode contact for organic light-emitting diodes. The external quantum efficiency measured from these devices was about 0.3% at a current density of 100 A/m2.
Xiaotong JiangKeng Lin WongMan‐Keung FungSeung-Eui Lee
Denghui XuZhenbo DengYing XuJing XiaoChunjun LiangZhiliang PeiChao Sun
Joel N. DuenowTimothy A. GessertD. M. WoodTeresa M. BarnesMatthew YoungBobby ToTimothy J. Coutts
Heungsoo KimJ. S. HorwitzGary P. KushtoS. B. QadriZakya H. KafafiDouglas B. Chrisey