JOURNAL ARTICLE

Note: Curve fit models for atomic force microscopy cantilever calibration in water

Scott KennedyDaniel G. ColeRobert L. Clark

Year: 2011 Journal:   Review of Scientific Instruments Vol: 82 (11)Pages: 116107-116107   Publisher: American Institute of Physics

Abstract

Atomic force microscopy stiffness calibrations performed on commercial instruments using the thermal noise method on the same cantilever in both air and water can vary by as much as 20% when a simple harmonic oscillator model and white noise are used in curve fitting. In this note, several fitting strategies are described that reduce this difference to about 11%.

Keywords:
Cantilever Calibration Calibration curve Atomic force microscopy Stiffness Curve fitting Microscopy Materials science Harmonic oscillator Atomic force acoustic microscopy Noise (video) Magnetic force microscope Physics Optics Nanotechnology Computer science Statistics Mathematics Composite material

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2
Cited By
0.19
FWCI (Field Weighted Citation Impact)
5
Refs
0.58
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Near-Field Optical Microscopy
Physical Sciences →  Engineering →  Biomedical Engineering

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