Cantilever Spring-Constant Calibration in Atomic Force Microscopy

Peter J. Cumpson; Charles A. Clifford; José F. Portolés; James E. Johnstone; Martin Munz

doi:10.1007/978-3-540-74080-3_8

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Cantilever Spring-Constant Calibration in Atomic Force Microscopy

Peter J. Cumpson Charles A. Clifford José F. Portolés James E. Johnstone Martin Munz

Year: 2007 Pages: 289-314

DOI: 10.1007/978-3-540-74080-3_8

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Keywords:

Cantilever Calibration Nanoindentation Spring (device) Stiffness Hamaker constant Force spectroscopy Nanotechnology Microscope Atomic force microscopy Constant (computer programming) Materials science Optics Physics van der Waals force Composite material Computer science Molecule Thermodynamics

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Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Mechanical and Optical Resonators

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Near-Field Optical Microscopy

Physical Sciences → Engineering → Biomedical Engineering

Cantilever Spring-Constant Calibration in Atomic Force Microscopy

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