JOURNAL ARTICLE
CEMS study of silicon implanted iron
Year: 1995 Journal: Hyperfine Interactions Vol: 95 (1)Pages: 161-173 Publisher: Springer Science+Business Media
Keywords:
Conversion electron mössbauer spectroscopy Auger electron spectroscopy Silicon Annealing (glass) Materials science Ion implantation Analytical Chemistry (journal) Spectroscopy Ion Mössbauer spectroscopy Phase (matter) Nuclear magnetic resonance Mössbauer effect Chemistry Crystallography Metallurgy Nuclear physics
Metrics
8
Cited By
1.12
FWCI (Field Weighted Citation Impact)
28
Refs
0.77
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Semiconductor materials and interfaces
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
Silicon and Solar Cell Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Metallic Glasses and Amorphous Alloys
Physical Sciences → Engineering → Mechanical Engineering
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