JOURNAL ARTICLE

Design of four-transistor Pixel for high speed CMOS image

Abstract

This paper designs and tests a series of high speed four-transistor Pixels with 0.13µm CMOS process. The prototype sensor contains 256×128 pixels with 8 different pixel architectures. Pixel size is 10µm×10µm. The measured sensitivity is 17.3V/lux·s, conversion gain is 49.6µV/e-, non-linearity is 3.6%, read noise is 23e-and dynamic range is 60dB. The optimizing design effectively improves the performance of high speed four-transistor Pixel.

Keywords:
Pixel Linearity Transistor CMOS Image sensor Sensitivity (control systems) Dynamic range Noise (video) Fixed-pattern noise CMOS sensor Computer science Electronic engineering Artificial intelligence Electrical engineering Image (mathematics) Engineering Computer vision Voltage

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0.47
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6
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0.70
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Citation History

Topics

CCD and CMOS Imaging Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Infrared Target Detection Methodologies
Physical Sciences →  Engineering →  Aerospace Engineering
Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology

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