JOURNAL ARTICLE

Characterization of AlxGa1−xN layers grown by molecular beam epitaxy

Hyonju KimThomas Andersson

Year: 2001 Journal:   Physica B Condensed Matter Vol: 308-310 Pages: 93-97   Publisher: Elsevier BV
Keywords:
Sputtering Molecular beam epitaxy Sapphire Epitaxy Substrate (aquarium) Materials science Layer (electronics) Secondary ion mass spectrometry Diffraction Atomic force microscopy Analytical Chemistry (journal) Crystallography Chemistry Ion Thin film Optics Nanotechnology Geology Physics

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3
Cited By
0.19
FWCI (Field Weighted Citation Impact)
13
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0.54
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Citation History

Topics

GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
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