JOURNAL ARTICLE

<title>Picosecond Electronic Relaxations In Amorphous Semiconductors</title>

J. Tauc

Year: 1983 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 0439 Pages: 6-13   Publisher: SPIE

Abstract

Using the pump and probe technique the relaxation processes of photogenerated carriers in amorphous tetrahedral semiconductors and chalcogenide glasses in the time domain from 0.5 Ps to 1.4 ns have been studied. The results obtained on the following phenomena are reviewed: hot carrier thermalization in amorphous silicon; trapping of carriers in undoped a-Si:H; trapping of carriers in deep traps produced by doping; geminate recombination in As2S3-xSex glasses.

Keywords:
Picosecond Materials science Chalcogenide Amorphous solid Trapping Doping Amorphous semiconductors Thermalisation Relaxation (psychology) Silicon Semiconductor Amorphous silicon Optoelectronics Carrier lifetime Atomic physics Optics Physics Crystallography Crystalline silicon Chemistry Laser

Metrics

3
Cited By
0.46
FWCI (Field Weighted Citation Impact)
41
Refs
0.62
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Phase-change materials and chalcogenides
Physical Sciences →  Materials Science →  Materials Chemistry
Glass properties and applications
Physical Sciences →  Materials Science →  Ceramics and Composites
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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