&lt;title&gt;Picosecond And Femtosecond Diagnostics Of Semiconductors&lt;/title&gt;

E. Wintner; James G. Fujimoto; Erich P. Ippen

doi:10.1117/12.939298

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<title>Picosecond And Femtosecond Diagnostics Of Semiconductors</title>

E. Wintner James G. Fujimoto Erich P. Ippen

Year: 1984 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 0452 Pages: 142-145 Publisher: SPIE

DOI: 10.1117/12.939298

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Abstract

Ultrashort light pulses are used to study carrier dynamics in highly excited semiconductor materials. Picosecond pulses from a cw modelocked Nd:YAG laser create carriers and probe nonlinear (Auger) recombination in InGaAs and InGaAsP epilayers. Femtosecond continuum pulses from a dye oscillator/amplifier system monitor the spectral dynamics of free excitons in CdSe following optical excitation.

Keywords:

Femtosecond Picosecond Optoelectronics Auger effect Materials science Exciton Laser Nanosecond Excited state Ultrashort pulse Semiconductor Optical amplifier Excitation Amplifier Optics Auger Atomic physics Physics

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Laser-Matter Interactions and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

<title>Picosecond And Femtosecond Diagnostics Of Semiconductors</title>

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