This paper describes a fluorescent lamp inspection system designed for a major North American manufacturer. Operating 24 hours a day it inspects up to 16 lamp bases per hour for nine common manufacturing defects using parallel processing hardware and morphology algorithms. Hardware and software techniques used to build a robust and reliable system relatively insensitive to variations in lighting conditions and lamp appearance are described.
J. W. MorrisJoseph Notarangelo
David R. PatekKenneth W. TobinL. Jachter
William A. ParkynDavid G. Pelka