JOURNAL ARTICLE

<title>Machine vision inspection of fluorescent lamps</title>

N. BainsFrank David

Year: 1991 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 1386 Pages: 232-242   Publisher: SPIE

Abstract

This paper describes a fluorescent lamp inspection system designed for a major North American manufacturer. Operating 24 hours a day it inspects up to 16 lamp bases per hour for nine common manufacturing defects using parallel processing hardware and morphology algorithms. Hardware and software techniques used to build a robust and reliable system relatively insensitive to variations in lighting conditions and lamp appearance are described.

Keywords:
Fluorescent lamp Software Computer science Fluorescence Machine vision Fluorescent light Computer hardware Computer vision Artificial intelligence Engineering Embedded system Operating system Electrical engineering Optics Physics

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Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Color Science and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics

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