JOURNAL ARTICLE

<title>Machine vision inspection of technical ceramics</title>

David R. PatekKenneth W. TobinL. Jachter

Year: 1996 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 2665 Pages: 253-257   Publisher: SPIE

Abstract

Coors Ceramics Company produces flat rectangular ceramic substrates for technical applications. Presently, finished substrates are inspected by human inspectors for dimensional tolerance and for the absence of a variety of possible surface defects. In a two-phase effort, we developed a system that could measure part dimensional parameters and inspect for surface defects. Dimensional parameters include part width, length, edge straightness, and corner perpendicularity. Surface defects include surface contamination, blemishes, open cracks, edge chips, burrs, pits, dents, ridges, blisters, and hairline cracks. We employed highly parallel pipeline image processing hardware to achieve a throughput rate of 1 part every 2 seconds.

Keywords:
Pipeline (software) Enhanced Data Rates for GSM Evolution Ceramic Surface (topology) Machine vision Materials science Computer science Engineering drawing Mechanical engineering Engineering Artificial intelligence Composite material Geometry

Metrics

3
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.20
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Advanced Surface Polishing Techniques
Physical Sciences →  Engineering →  Biomedical Engineering

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