JOURNAL ARTICLE

Eu-doped GaN films grown on sapphire and GaAs substrates by RF magnetron sputtering

Shinji YudateToshiaki FujiiSho Shirakata

Year: 2009 Journal:   IOP Conference Series Materials Science and Engineering Vol: 1 Pages: 012028-012028   Publisher: IOP Publishing

Abstract

The growth of Eu-doped GaN (GaN:Eu) films has been performed on GaAs (100) substrates using RF magnetron sputtering method. The GaN layers exhibit a wurtzite structure. Substrate temperature and the pressure during the deposition do not influence the orientation of GaN:Eu films. After annealing of GaN films in NH3, a strong red luminescence at 622 nm due to Eu3+ ions has been observed.

Keywords:
Wurtzite crystal structure Materials science Sapphire Sputter deposition Optoelectronics Doping Annealing (glass) Luminescence Sputtering Cavity magnetron Thin film Nanotechnology Metallurgy Optics Zinc Laser

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Topics

GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
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Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
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Physical Sciences →  Materials Science →  Materials Chemistry

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