Yoshihiro KobayashiKosuke IkedaYukinobu Shinoda
Deep levels in MOCVD-grown GaAs/(100)Ge were studied by the deep-level Fourier spectroscopy (DLFS) method. Single domain wafers contain EL2 similar to homoepitaxial wafers. EL2 was not observed in antiphase domain wafers, where detected deep traps were found to consist of more than two traps.
Tetsuo SogaShiro SakaiMasayoshi UmenoShūzo Hattori
Hadas ShtrikmanA. RaizmanM. OronД. Егер
Yeong Ho WuiTae Won KangT.W Kim
Seth A. FortunaXi ZengXiuling Li
D.W.E. AllsoppА. R. PeakerE. J. ThrushG. Wale-Evans