JOURNAL ARTICLE

X-ray mask replication using a Suss stepper at CXrL

Q. LeonardJohn WallaceOlga VladimirskyYuli VladimirskyKlaus SimonF. Cerrina

Year: 1997 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 3048 Pages: 299-299   Publisher: SPIE

Abstract

Crucial to any viable lithographic mask technology is the requirement that a given mask pattern be usable for the hundreds of thousands of exposures in a production environment. In a conventional approach this would be accomplished by making robust masks. A better strategy to ensure the longevity of the pattern itself, is realized by producing many defect-free copies of master masks. This approach is especially important in the case of x-ray masks, although the optical masks also have a limited usable lifetime. X-ray mask generation is accomplished today via e- beam lithography, which as a replication method has several inherent disadvantages, including low speed and high cost. X- ray replication is the best solution. In this paper, we describe the development of a mask replication method realized on a Suss x-ray stepper. The approach is based on supporting parent mask and the daughter blank in fully kinematic fixtures during replication, ensuring a minimum of distortion, excellent gap control and optimized exposure conditions. Minor modifications of the mask mounting fixtures, the replication setup, and details of processing are presented. Preliminary results of mask replication are also shown.

Keywords:
Replication (statistics) USable Stepper Computer science Lithography Blank Replica Optics Materials science Optoelectronics Physics

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Topics

Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Advanced Surface Polishing Techniques
Physical Sciences →  Engineering →  Biomedical Engineering

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