JOURNAL ARTICLE

High aspect ratio aligned multilayer microstructure fabrication

K. Y. LeeS. A. RishtonT. H. P. Chang

Year: 1994 Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Vol: 12 (6)Pages: 3425-3430   Publisher: American Institute of Physics

Abstract

This paper presents a technique for fabricating precisely aligned high aspect ratio multilayer microstructures based on anodic bonding of silicon and PyrexTM glass. The process involves stacking alternate silicon substrates containing patterns in two dimensions with thin Pyrex glass spacers to form tall three-dimensional structures. The methods used for accurately aligning the layers by optical microscopy and for bonding the layers anodically are described. The application of this technique for building fully functional microlenses for electron-beam microcolumns is presented.

Keywords:
Materials science Fabrication Microstructure Stacking Silicon Anodic bonding Aspect ratio (aeronautics) Scanning electron microscope Optoelectronics Composite material Optics Nanotechnology

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21
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1.78
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0
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0.86
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Citation History

Topics

Electrowetting and Microfluidic Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced optical system design
Physical Sciences →  Engineering →  Biomedical Engineering
Optical Coatings and Gratings
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
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