Spectroscopic ellipsometry study on the optical dielectric properties of silver platinum alloy thin films

Guang Yang; Xiaojian Fu; Jingbo Sun; Ji Zhou

doi:10.1016/j.jallcom.2012.10.033

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Spectroscopic ellipsometry study on the optical dielectric properties of silver platinum alloy thin films

Guang Yang Xiaojian Fu Jingbo Sun Ji Zhou

Year: 2012 Journal: Journal of Alloys and Compounds Vol: 551 Pages: 352-359 Publisher: Elsevier BV

DOI: 10.1016/j.jallcom.2012.10.033

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Keywords:

Materials science Alloy Platinum Dielectric Ellipsometry Annealing (glass) Thin film Silicon Surface roughness Permittivity Sputter deposition Analytical Chemistry (journal) Sputtering Composite material Metallurgy Optoelectronics Nanotechnology Chemistry

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Plasmonic and Surface Plasmon Research

Physical Sciences → Engineering → Biomedical Engineering

Optical Coatings and Gratings

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Gold and Silver Nanoparticles Synthesis and Applications

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Spectroscopic ellipsometry study on the optical dielectric properties of silver platinum alloy thin films

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