Thermal dependence of optical properties of silver thin films studied by spectroscopic ellipsometry

Abstract

The thermal dependence of the dielectric constants of silver thin films were investigated between 300 K and 650 K by spectroscopic ellipsometer in the energy range 1.5 to 5 eV. The studies showed an increase in the imaginary part (ε2) of the dielectric function, a shift of ∼300 meV in the onset of the main absorption (L3–L2'(EF)), appearance of additional absorption above 500 K which is attributed to (L2'- L1) and increased broadening of the absorption spectra owing to smearing of Fermi level. It was found that the unscreened plasma frequency ωpu associated with resonant oscillations of conduction electrons increased while the relaxation time decreased with increase in temperature.