Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry

Yuanhao Kang; T. H. Ghong; Y. W. Jung; Jeoung-Woo Byun; Sung Kim; Young Dong Kim; Tae-Geun Seong; Kyung‐Hoon Cho; Sahn Nahm

doi:10.1016/j.tsf.2010.01.053

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Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry

Yuanhao Kang T. H. Ghong Y. W. Jung Jeoung-Woo Byun Sung Kim Young Dong Kim Tae-Geun Seong Kyung‐Hoon Cho Sahn Nahm

Year: 2010 Journal: Thin Solid Films Vol: 518 (22)Pages: 6526-6530 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2010.01.053

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Keywords:

Ellipsometry Thin film Materials science Bismuth Annealing (glass) Refractive index Analytical Chemistry (journal) Pulsed laser deposition Optics Lithium niobate Optoelectronics Chemistry Nanotechnology Composite material

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Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Photorefractive and Nonlinear Optics

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Optical and Acousto-Optic Technologies

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry

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