JOURNAL ARTICLE

Influence of the oxide charge build-up during Fowler-Nordheim stress on the current-voltage characteristics of metal-oxide-semiconductor capacitors

Simon ElrharbiM. Jourdain

Year: 1995 Journal:   Journal of Non-Crystalline Solids Vol: 187 Pages: 175-180   Publisher: Elsevier BV
Keywords:
Oxide Materials science Quantum tunnelling Voltage Capacitance Capacitor Stress (linguistics) Current (fluid) Cathode Charge (physics) Optoelectronics Substrate (aquarium) Impact ionization Semiconductor Condensed matter physics Electrical engineering Ionization Chemistry Electrode Physics Ion Engineering Metallurgy

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FWCI (Field Weighted Citation Impact)
8
Refs
0.16
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Citation History

Topics

Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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