JOURNAL ARTICLE

Combined x-ray absorption spectroscopy and x-ray powder diffraction

Andrew J. DentG. N. GreavesJohn W. CouvesJohn Meurig Thomas

Year: 1992 Journal:   AIP conference proceedings Vol: 258 Pages: 631-641   Publisher: American Institute of Physics

Abstract

The complementary nature of x‐ray absorption fine structure (XAFS) spectroscopy and x‐ray diffraction (XRD) is described. In particular XAFS records the local structure whilst XRD detects the long range crystallinity enabling the heterogeneity of materials like single phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x‐ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed oxide catalysts.

Keywords:
X-ray absorption fine structure Materials science Diffraction Absorption (acoustics) Spectroscopy Absorption spectroscopy X-ray crystallography Optics X-ray absorption spectroscopy X-ray spectroscopy Analytical Chemistry (journal) Crystallinity X-ray XANES Chemistry Physics

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Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry
Machine Learning in Materials Science
Physical Sciences →  Materials Science →  Materials Chemistry
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences →  Physics and Astronomy →  Radiation
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