Andrew J. DentG.E. DerbyshireG. N. GreavesC. A. RamsdaleJohn W. CouvesRichard H. JonesC. Richard A. CatlowJohn Meurig Thomas
The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure while XRD detects the long-range crystallinity enabling the heterogeneity of materials like single-phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed-oxide catalysts.
E. ErcanSusan M. MiniMohan RamanathanO.B. Hyun
I. UschmannEckhart FoersterP. GibbonChristian ReichThomas FeurerA. MorakR. SauerbreyA. RousseP. AudebertJean-Paul GeindreJean-Claude J. Gauthier
Guangjun ChengFang ShanAbhi FreyerTing Guo
L. D. Van WoerkomR. R. FreemanWilliam E. CookeT. J. McIlrath