JOURNAL ARTICLE

<title>Combined x-ray absorption spectroscopy and x-ray powder diffraction</title>

Andrew J. DentG.E. DerbyshireG. N. GreavesC. A. RamsdaleJohn W. CouvesRichard H. JonesC. Richard A. CatlowJohn Meurig Thomas

Year: 1991 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 1550 Pages: 97-107   Publisher: SPIE

Abstract

The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure while XRD detects the long-range crystallinity enabling the heterogeneity of materials like single-phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed-oxide catalysts.

Keywords:
X-ray absorption fine structure Materials science Diffraction Absorption (acoustics) Spectroscopy X-ray Analytical Chemistry (journal) X-ray absorption spectroscopy Crystallinity X-ray photoelectron spectroscopy X-ray crystallography Absorption spectroscopy X-ray spectroscopy Optics Chemistry Physics Nuclear magnetic resonance

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Citation History

Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry
Machine Learning in Materials Science
Physical Sciences →  Materials Science →  Materials Chemistry
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences →  Physics and Astronomy →  Radiation

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