Thickness dependence of optoelectrical properties of tungsten-doped indium oxide films

Ram K. Gupta; K. Ghosh; P.K. Kahol

doi:10.1016/j.apsusc.2009.06.099

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Thickness dependence of optoelectrical properties of tungsten-doped indium oxide films

Ram K. Gupta K. Ghosh P.K. Kahol

Year: 2009 Journal: Applied Surface Science Vol: 255 (21)Pages: 8926-8930 Publisher: Elsevier BV

DOI: 10.1016/j.apsusc.2009.06.099

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Keywords:

Materials science Crystallinity Tungsten Indium Band gap Doping Diffraction Surface roughness Oxide Analytical Chemistry (journal) Electrical resistivity and conductivity Thin film Spectroscopy Pulsed laser deposition Optics Optoelectronics Composite material Nanotechnology Chemistry Metallurgy

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Thickness dependence of optoelectrical properties of tungsten-doped indium oxide films

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