JOURNAL ARTICLE

Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

Qun ZhangXifeng LiGuifeng Li

Year: 2008 Journal:   Thin Solid Films Vol: 517 (2)Pages: 613-616   Publisher: Elsevier BV
Keywords:
Electrical resistivity and conductivity Materials science Indium Thin film Doping Tungsten Oxide Sputtering Diffraction Optoelectronics Analytical Chemistry (journal) Optics Nanotechnology Chemistry Metallurgy Electrical engineering

Metrics

29
Cited By
1.33
FWCI (Field Weighted Citation Impact)
20
Refs
0.79
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Transition Metal Oxide Nanomaterials
Physical Sciences →  Materials Science →  Polymers and Plastics

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