Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

Qun Zhang; Xifeng Li; Guifeng Li

doi:10.1016/j.tsf.2008.07.023

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Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

Qun Zhang Xifeng Li Guifeng Li

Year: 2008 Journal: Thin Solid Films Vol: 517 (2)Pages: 613-616 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2008.07.023

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Keywords:

Electrical resistivity and conductivity Materials science Indium Thin film Doping Tungsten Oxide Sputtering Diffraction Optoelectronics Analytical Chemistry (journal) Optics Nanotechnology Chemistry Metallurgy Electrical engineering

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Thin-Film Transistor Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Transition Metal Oxide Nanomaterials

Physical Sciences → Materials Science → Polymers and Plastics

Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

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