Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou; Kaijun Yi; Masoud Mahjouri‐Samani; Wei Xiong; Yongfeng Lu; S. H. Liou

doi:10.1016/j.apsusc.2008.11.035

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Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou Kaijun Yi Masoud Mahjouri‐Samani Wei Xiong Yongfeng Lu S. H. Liou

Year: 2008 Journal: Applied Surface Science Vol: 255 (7)Pages: 4341-4346 Publisher: Elsevier BV

DOI: 10.1016/j.apsusc.2008.11.035

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Keywords:

Carbon nanotube Scanning electron microscope Field electron emission Materials science Acceleration voltage Cathode ray Electron Field emission microscopy Nanotechnology Field emission gun Electron microscope Electron beam-induced deposition Voltage Optoelectronics Optics Scanning transmission electron microscopy Diffraction Physics Composite material

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Carbon Nanotubes in Composites

Physical Sciences → Materials Science → Materials Chemistry

Advanced Electron Microscopy Techniques and Applications

Life Sciences → Biochemistry, Genetics and Molecular Biology → Structural Biology

Ion-surface interactions and analysis

Physical Sciences → Engineering → Computational Mechanics

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

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