JOURNAL ARTICLE

Characterization of (Pb1-xLax)TiO3 thin films grown by radio-frequency magnetron sputtering and their electrical properties

Su-Jin ChaeSang‐Shik ParkSoon‐Gil YoonWon-Jae LeeHo‐Gi Kim

Year: 1995 Journal:   Integrated ferroelectrics Vol: 10 (1-4)Pages: 63-72   Publisher: Taylor & Francis

Abstract

Abstract Microstructure, composition, and electrical properties were investigated for polycrystalline (Pb,La)TiO3 (PLT) thin films deposited from the 10 and 20 mol% excess PbO targets. The compositional analysis by Rutherford backscattering pectroscopy shows that PLT films from 20 mol% excess PbO have almost stoichiometric composition and a dense structure. The dielectric constant and a dissipation factor of PLT films from 20 mol% excess PbO were 640 and 0.02 at 100 kHz, respectively. The conduction behavior of PLT films from 10 mol% excess PbO suggested a bulk-limited Poole-Frenkel emission in the high field region, while from 20 mol% excess PbO induced a electrode-limited Schottky emission.

Keywords:
Materials science Dissipation factor Analytical Chemistry (journal) Dielectric Thin film Microstructure Stoichiometry Crystallite Sputter deposition Sputtering Optoelectronics Nanotechnology Physical chemistry Composite material Metallurgy

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Citation History

Topics

Ferroelectric and Piezoelectric Materials
Physical Sciences →  Materials Science →  Materials Chemistry
Acoustic Wave Resonator Technologies
Physical Sciences →  Engineering →  Biomedical Engineering
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry

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