P. A. CoonMichael L. WiseZane H. WalkerSteven M. GeorgeDavid A. Roberts
Germanium was deposited on Si(111) 7×7 by the adsorption and thermal decomposition of diethylgermane [(CH3CH2)2GeH2] (DEG). The DEG reaction products were CH2■CH2 and H2, which desorbed at 700 and 800 K, respectively, as observed by laser-induced thermal desorption and temperature programmed desorption techniques. The desorption of atomic Ge was also monitored at approximately 1200 K. The production of ethylene was consistent with a β-hydride elimination mechanism for the surface ethyl groups, i.e., Ge—CH2CH3→GeH+CH2■CH2. The initial sticking coefficient of DEG decreased with increasing surface temperature and a saturation coverage was obtained after exposures of E≳700 L at 200 K. This saturation behavior indicates that DEG may be useful for the controlled growth of Ge atomic layers on silicon surfaces.
P.A. CoonM.L. WiseZ.H. WalkerS.M. George
P. A. CoonMichael L. WiseZane H. WalkerSteven M. George
P. A. CoonMichael L. WiseSteven M. George
Anne C. DillonM. B. RobinsonSteven M. GeorgeDavid A. Roberts
Anne C. DillonM. B. RobinsonSteven M. GeorgeDavid A. Roberts