Preparation and characterization of Ba1−xSrxTiO3 thin films deposited on Pt/SiO2/Si by sol–gel method

Rubing Zhang; Chunsheng Yang; Ding Gui-pu; Jie Feng

doi:10.1016/j.materresbull.2005.04.029

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Preparation and characterization of Ba1−xSrxTiO3 thin films deposited on Pt/SiO2/Si by sol–gel method

Rubing Zhang Chunsheng Yang Ding Gui-pu Jie Feng

Year: 2005 Journal: Materials Research Bulletin Vol: 40 (9)Pages: 1490-1496 Publisher: Elsevier BV

DOI: 10.1016/j.materresbull.2005.04.029

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Keywords:

Materials science Thin film Scanning electron microscope Dielectric Sol-gel Analytical Chemistry (journal) Microstructure Perovskite (structure) Annealing (glass) Chemical engineering Nanotechnology Optoelectronics Composite material Chemistry

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Ferroelectric and Piezoelectric Materials

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Preparation and characterization of Ba1−xSrxTiO3 thin films deposited on Pt/SiO2/Si by sol–gel method

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