JOURNAL ARTICLE
Electronic Speckle Pattern Interferometry for Micromechanical Measurements
Sigitas TamulevičiusL. AugulisGiedrius LaukaitisM. Žadvydas
Year: 2002 Journal: Advanced Engineering Materials Vol: 4 (8)Pages: 546-550 Publisher: Wiley
Abstract
A new optical setup that could be used for the analysis of displacement (or strain) of objects with diffuse as well as mirror-like reflecting (specular) surfaces is presented here together with the algorithm of data analysis. Combination of these two new approaches allows to minimize the area of analysis and to extend the class of materials to which the Electronic Speckle Pattern Interferometry (ESPI) can be applied.
Keywords:
Electronic speckle pattern interferometry Speckle pattern Interferometry Specular reflection Materials science Speckle imaging Optics Displacement (psychology) Shearography Physics
Metrics
7
Cited By
1.36
FWCI (Field Weighted Citation Impact)
8
Refs
0.82
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Optical measurement and interference techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences → Engineering → Mechanical Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
Related Documents
BOOK-CHAPTER
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
J.N. ButtersRobert JonesC. Wykes
Elsevier eBooks Year: 1978 Pages: 111-158
BOOK-CHAPTER
Electronic speckle pattern interferometry
Cambridge University Press eBooks Year: 1995 Pages: 453-476