BOOK-CHAPTER
Electronic speckle pattern interferometry
Year: 1995 Cambridge University Press eBooks Pages: 453-476 Publisher: Cambridge University Press
Abstract
The use of television image acquisition and computer image processing has revolutionized optical methods of metrology. A prime example is in the area of speckle correlation interferometry, which is discussed in this chapter. The implications of detector size are discussed, and limitations and advantages are outlined. An understanding of the material in Chapters 18 and 20 is strongly recommended.
Keywords:
Electronic speckle pattern interferometry Interferometry Speckle pattern Speckle imaging Optics Remote sensing Geology Physics
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Topics
Optical measurement and interference techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
Advanced Measurement and Metrology Techniques
Physical Sciences → Engineering → Mechanical Engineering
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