JOURNAL ARTICLE

A novel high aspect ratio technology for MEMS fabrication using standard silicon wafers

A. BertzMatthias KüchlerR. KnöflerThomas Geßner

Year: 2002 Journal:   Sensors and Actuators A Physical Vol: 97-98 Pages: 691-701   Publisher: Elsevier BV
Keywords:
Wafer Fabrication Microelectromechanical systems Materials science Silicon Aspect ratio (aeronautics) Parasitic capacitance Capacitance Optoelectronics Microfabrication Nanotechnology

Metrics

52
Cited By
3.45
FWCI (Field Weighted Citation Impact)
7
Refs
0.93
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Acoustic Wave Resonator Technologies
Physical Sciences →  Engineering →  Biomedical Engineering
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