Magnetic measurements on ferromagnetic behavior in the bulk II–VI diluted magnetic semiconductor Zn1−xCrxTe

Abstract

Magnetic measurements on the ferromagnetic behavior in the bulk II–VI diluted magnetic semiconductor Zn1−xCrxTe were made on two x=0.0033 single crystals taken from different regions of the same boule. Ferromagnetism was verified in both samples by an Arrott plot analysis with a transition temperature at 365 K (well above room temperature). For both samples at room temperature, the coercive field is ∼0.0100 T and the remanent magnetization is 23% of the saturated value. The similarity in the observed ferromagnetic behavior between the two samples suggests that a stable CryTez or possibly ZnxCryTez precipitate phase is responsible, although a Cr-rich region in the bulk Zn1−xCrxTe itself cannot currently be conclusively ruled out as the source.