JOURNAL ARTICLE

Amorphous-Silicon gate GaAs FET's

M. SuzukiKatsumi MuraseK. AsaiK. Kurumada

Year: 1983 Journal:   IEEE Electron Device Letters Vol: 4 (10)Pages: 358-359   Publisher: Institute of Electrical and Electronics Engineers

Abstract

Silicon-germanium-boron ternary amorphous alloy has been applied to GaAs FET as a gate contact material. A good Schottky contact with a barrier height as large as 0.94 V has been realized. Schottky-barrier gate GaAs FET's fabricated using the amorphous film as a gate contact layer exhibit excellent normally off FET characteristics of a large saturated drain curent, which has never been attained by conventional GaAs MESFET's.

Keywords:
MESFET Materials science Schottky barrier Amorphous solid Optoelectronics Schottky diode Silicon Amorphous silicon Metal–semiconductor junction Gallium arsenide Field-effect transistor Electrical engineering Transistor Crystalline silicon Diode Voltage Chemistry Crystallography

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0.76
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Topics

Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Photonic Crystals and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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