An active load‐pull measurement system using two six‐port reflectometers

Frédérique Deshours; E. Bergeault; L. Jallet; B. Huyart

doi:10.1002/mop.4650071415

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An active load‐pull measurement system using two six‐port reflectometers

Frédérique Deshours E. Bergeault L. Jallet B. Huyart

Year: 1994 Journal: Microwave and Optical Technology Letters Vol: 7 (14)Pages: 679-684 Publisher: Wiley

DOI: 10.1002/mop.4650071415

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Abstract

Abstract This article presents a microwave active Load‐Pull measurement system, using two wide‐band six‐port junctions in order to have nonlinear characterization of power transistors. Experimental results performed on a 900‐μm MESFET for different operating classes are reported and discussed. © 1994 John Wiley & Sons, Inc.

Keywords:

MESFET Port (circuit theory) Active load Load pull Microwave Electrical engineering Nonlinear system Engineering System of measurement Electronic engineering Transistor Physics Telecommunications Field-effect transistor Voltage

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Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Radio Frequency Integrated Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave Engineering and Waveguides

Physical Sciences → Engineering → Electrical and Electronic Engineering

An active load‐pull measurement system using two six‐port reflectometers

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