JOURNAL ARTICLE
Characterization of inhomogeneity in TiO2 thin films prepared by pulsed dc reactive magnetron sputtering
Mati HorprathumPitak EiamchaiPongpan ChindaudomNoppadon NuntawongViyapol PatthanasettakulPuenisara LimnonthakulP. Limsuwan
Year: 2011 Journal: Thin Solid Films Vol: 520 (1)Pages: 272-279 Publisher: Elsevier BV
Keywords:
Materials science Thin film Crystallinity Microstructure Pulsed DC Sputtering Sputter deposition Transmission electron microscopy Ellipsometry Scanning electron microscope Analytical Chemistry (journal) Optics Optoelectronics Composite material Nanotechnology Chemistry
Metrics
27
Cited By
1.24
FWCI (Field Weighted Citation Impact)
30
Refs
0.78
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
ZnO doping and properties
Physical Sciences → Materials Science → Materials Chemistry
Gas Sensing Nanomaterials and Sensors
Physical Sciences → Engineering → Electrical and Electronic Engineering
Copper-based nanomaterials and applications
Physical Sciences → Materials Science → Materials Chemistry
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