JOURNAL ARTICLE

Fabrication of submicron polysilicon lines by conventional techniques

K. H. NicholasH.E. BrockmanI. J. Stemp

Year: 1975 Journal:   Applied Physics Letters Vol: 26 (7)Pages: 398-399   Publisher: American Institute of Physics

Abstract

A new method of making fine geometry polysilicon lines has been developed. It requires no special apparatus or critical processing. Silicon gate MOST’s with dimensions of about 1 μm have been fabricated. Applications of the fine geometry MOST’s to the fabrication of high−packing−density MOSIC’s and high−frequency transistors are outlined.

Keywords:
Fabrication Materials science Polysilicon depletion effect Silicon Transistor Optoelectronics Nanotechnology Engineering physics Electrical engineering Engineering Gate oxide Voltage

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10
Cited By
1.63
FWCI (Field Weighted Citation Impact)
1
Refs
0.81
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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