JOURNAL ARTICLE
Infrared spectroscopy of semiconductor surfaces: H-terminated silicon surfaces
Year: 1993 Journal: Journal of Molecular Structure Vol: 292 Pages: 65-80 Publisher: Elsevier BV
Keywords:
Chemistry Silicon Infrared spectroscopy Vicinal Infrared Semiconductor Spectroscopy Molecular physics Ab initio quantum chemistry methods Chemical physics Analytical Chemistry (journal) Optoelectronics Molecule Optics Materials science Organic chemistry
Metrics
35
Cited By
2.67
FWCI (Field Weighted Citation Impact)
47
Refs
0.90
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Silicon Nanostructures and Photoluminescence
Physical Sciences → Materials Science → Materials Chemistry
Thin-Film Transistor Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
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