JOURNAL ARTICLE

The Schottky-barrier height of the contacts between some rare-earth metals (and silicides) and p-type silicon

H. NordeJorge de Sousa PiresF. M. d’HeurleFrancesco PesaventoS. PeterssonP.A. Tove

Year: 1981 Journal:   Applied Physics Letters Vol: 38 (11)Pages: 865-866   Publisher: American Institute of Physics

Abstract

Some rare-earth elements, Tb, Er, Yb (including Y) and some of their respective silicides were found to make ohmic contacts to n-type silicon. Forward I/V and photoresponse measurements give values of about 0.7 eV for the Schottky-barrier height to p-type silicon. The sum of this value and of the experimentally estimated barrier height to n-type silicon, 0.4 eV, corresponds to the band gap of silicon.

Keywords:
Silicon Ohmic contact Schottky barrier Materials science Band gap Rare earth Metal–semiconductor junction Schottky diode Condensed matter physics Optoelectronics Nanotechnology Metallurgy Physics

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17
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0.85
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Citation History

Topics

Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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