Gate Engineering For Performance And Reliability In Deep-submicron CMOS Technology

JOURNAL ARTICLE

Year: 1997 Journal: Symposium on VLSI Technology Pages: 105-106

DOI: 10.1109/vlsit.1997.623717

Keywords:

CMOS Reliability (semiconductor) Computer science Reliability engineering Logic gate Electronic engineering Circuit reliability Engineering Physics

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0.97

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Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advancements in Semiconductor Devices and Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering