JOURNAL ARTICLE

Gate Engineering For Performance And Reliability In Deep-submicron CMOS Technology

Keywords:
CMOS Reliability (semiconductor) Computer science Reliability engineering Logic gate Electronic engineering Circuit reliability Engineering Physics

Metrics

9
Cited By
7.80
FWCI (Field Weighted Citation Impact)
2
Refs
0.97
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
© 2026 ScienceGate Book Chapters — All rights reserved.