JOURNAL ARTICLE

Elimination of shunting conductance effects in a low-cost capacitive-sensor interface

Xiujun LiGcm Meijer

Year: 2000 Journal:   IEEE Transactions on Instrumentation and Measurement Vol: 49 (3)Pages: 531-534   Publisher: Institute of Electrical and Electronics Engineers

Abstract

A low-cost and reliable interface for capacitive sensors, based on the use of a relaxation oscillator and a microcontroller, is presented. The novel interface system is designed to measure small capacitances in a reliable and accurate way even when the sensor capacitors are shunted by parasitic conductances. The problem of shunting conductances is solved by performing a series of eight measurements and using a new auto-calibration technique. Moreover, all multiplicative and additive errors of the interface are also eliminated by using this new auto-calibration technique. In the microcontroller, the final result is calculated based on the new measurement algorithm. A prototype has been built and tested. Experimental results show that the interface is able to measure a capacitance of 0-1.2 pF with a shunting conductance of up to 0.42 /spl mu/S, with a resolution and a relative accuracy of 0.03% and /spl plusmn/0.15%, respectively. The measurement time is about 400 ms.

Keywords:
Capacitive sensing Shunting Calibration Capacitor Microcontroller Capacitance Relaxation oscillator Interface (matter) Measure (data warehouse) Parasitic capacitance Electronic engineering Electrical engineering Computer science Engineering Physics Voltage Electrode

Metrics

18
Cited By
1.30
FWCI (Field Weighted Citation Impact)
8
Refs
0.82
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Sensor Technology and Measurement Systems
Physical Sciences →  Computer Science →  Computer Networks and Communications
Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering
Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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